Hideki Shindo
9Patents
4h-index
13Co-inventors
50Inventor score
Filing activity: Jan 16, 2001 → Sep 30, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6886264B2 | Reference fixture for roundness measuring instrument | Physics | 17 | Expired |
| US8336223B2 | Roundness measuring apparatus | Physics | 7 | Active |
| US7950164B2 | Surface texture measurement apparatus and roundness measuring apparatus | Physics | 6 | Active |
| US6526364B2 | Method and apparatus for measuring roundness | Performing Operations; Transporting | 6 | Expired |
| US8359908B2 | Surface texture measuring device | Physics | 3 | Active |
| US9441715B2 | Moving mechanism and form measuring apparatus | Emerging Cross-Sectional Technologies | 2 | Active |
| US9316476B2 | Profile measuring instrument, adjusting method for profile measuring instrument, and profile measuring method | Physics | 1 | Active |
| US8020309B2 | Circularity measuring apparatus | Physics | 1 | Active |
| US9644950B2 | Shape measuring apparatus and point sensor positioning unit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.