Patent · US Expired

Reference fixture for roundness measuring instrument

US6886264B2 · kind B2 · utility

17Cited by
9References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 7, 2004
Grant dateMay 3, 2005
Priority date
Expiry dateApr 7, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B7/282
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A reference fixture (20) for a roundness measuring instrument performs acquisition of origin information of a roundness measuring instrument (1) including a workpiece rotary mechanism (3) on which a workpiece is set and a probe (14) provided with a stylus (14a) and also performs calibration of the probe (14). The reference fixture (20) includes a mount (21), a calibration master (22) provided on a top face of the mount (21) for calibrating the sensitivity of the probe (14), an origin ball (23) disposed above the calibration master (22) for providing the origin information of the roundness measuring instrument (1) by the stylus (14a) of the probe (14), and a holder (25) that holds the origin ball (23).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.