Hirohiko Kitsuki
9Patents
1h-index
22Co-inventors
47Inventor score
Filing activity: Apr 5, 2006 → May 27, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7442929B2 | Scanning electron microscope | Electricity | 4 | Active |
| US7807966B2 | Scanning electron microscope | Electricity | 1 | Active |
| US9811897B2 | Defect observation method and defect observation device | Physics | 1 | Active |
| US11195694B2 | Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam device | Electricity | 0 | Active |
| US11211226B2 | Pattern cross-sectional shape estimation system and program | Electricity | 0 | Active |
| US11164720B2 | Scanning electron microscope and calculation method for three-dimensional structure depth | Electricity | 0 | Active |
| US11557457B2 | Charged particle beam apparatus | Electricity | 0 | Active |
| US8153970B2 | Scanning electron microscope | Electricity | 0 | Active |
| US8859962B2 | Charged-particle microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.