Hirotomo Yashima
4Patents
1h-index
4Co-inventors
30Inventor score
Filing activity: Sep 1, 2017 → Sep 12, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10809208B2 | X-ray inspection device, X-ray inspection method, and method of manufacturing structure | Physics | 15 | Active |
| US10809209B2 | Measurement processing device, x-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | Physics | 0 | Active |
| US10481106B2 | Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | Physics | 0 | Active |
| US10444165B2 | Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method | General | 0 | Revoked |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.