Hong-Da Lin
5Patents
1h-index
10Co-inventors
40Inventor score
Filing activity: Nov 5, 2013 → Sep 5, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9285677B2 | Lithography process on high topology features | Physics | 1 | Active |
| US9983257B2 | Test line patterns in split-gate flash technology | Electricity | 1 | Active |
| US11069419B2 | Test line letter for embedded non-volatile memory technology | Electricity | 0 | Active |
| US10163522B2 | Test line letter for embedded non-volatile memory technology | Electricity | 0 | Active |
| US9791775B2 | Lithography process on high topology features | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.