Ian Christopher Mayes
9Patents
4h-index
20Co-inventors
57Inventor score
Filing activity: Jan 26, 1996 → Nov 30, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7113276B1 | Micro defects in semi-conductors | Physics | 27 | Expired |
| US7446868B1 | Micro defects in semi-conductors | Physics | 20 | Active |
| US5797114A | Method and apparatus for mapping of semiconductor materials | Electricity | 6 | Expired |
| US8680852B2 | Method and apparatus for phase sensitive detection of eddy current measurements | Physics | 4 | Active |
| US7556725B2 | Sealing ring assembly and mounting method | Electricity | 1 | Active |
| US9482605B2 | Bond testing machine and cartridge for a bond testing machine comprising a plurality of test tools | Electricity | 1 | Active |
| US7713404B2 | Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurements | Electricity | 0 | Active |
| US11579058B2 | Bond test apparatus and method for testing the strength of bonds on electrical circuitry | Physics | 0 | Active |
| US7842179B2 | Sealing ring assembly and mounting method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.