Igor Germanenko
5Patents
3h-index
12Co-inventors
50Inventor score
Filing activity: Oct 23, 2003 → Dec 18, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7747062B2 | Methods, defect review tools, and systems for locating a defect in a defect review process | Physics | 13 | Active |
| US7088456B2 | Thin film thickness measurement using multichannel infrared sensor | Physics | 3 | Expired |
| US6961126B2 | Optical wavelength splitter | Physics | 3 | Expired |
| US9116445B2 | Resonant cavity conditioning for improved nonlinear crystal performance | Electricity | 2 | Active |
| US11581692B2 | Controlling pressure in a cavity of a light source | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.