Ill Hyun Park
3Patents
0h-index
11Co-inventors
31Inventor score
Filing activity: Aug 17, 2016 → Sep 20, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11764064B2 | Monitoring device, monitoring method and method of manufacturing semiconductor device using reflectivity of wafer | Physics | 0 | Active |
| US11158510B2 | Monitoring device, monitoring method and method of manufacturing semiconductor device using reflectivity of wafer | Physics | 0 | Active |
| US11478828B2 | Adhesive removing device and method | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.