James E. Rousey
3Patents
3h-index
4Co-inventors
43Inventor score
Filing activity: Aug 2, 1994 → Oct 19, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5422892A | Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices | Physics | 29 | Expired |
| US7323899B2 | System and method for resumed probing of a wafer | Physics | 20 | Active |
| US7148716B2 | System and method for the probing of a wafer | Physics | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.