Inventor · Saline, MI, US

James Marks

4Patents
4h-index
7Co-inventors
43Inventor score

Filing activity: Jan 29, 1993 → Feb 21, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US5923423A Heterodyne scatterometer for detecting and analyzing wafer surface defects Physics 104 Expired
US6868736B2 Ultra-miniature optical pressure sensing system Physics 81 Expired
US5343179A Miniaturized solenoid operated trip device Electricity 36 Expired
US6597446B2 Holographic scatterometer for detection and analysis of wafer surface deposits Physics 21 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.