James Michael Jarboe, Jr.
5Patents
3h-index
7Co-inventors
42Inventor score
Filing activity: Apr 30, 2002 → Apr 4, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7155637B2 | Method and apparatus for testing embedded memory on devices with multiple processor cores | Physics | 16 | Expired |
| US7940066B2 | BIST DDR memory interface circuit and method for testing the same | Physics | 7 | Active |
| US7834615B2 | Bist DDR memory interface circuit and method for self-testing the same using phase relationship between a data signal and a data strobe signal | Physics | 5 | Active |
| US8035407B2 | Bist DDR memory interface circuit and method for testing the same | Physics | 3 | Active |
| US6865694B2 | CPU-based system and method for testing embedded memory | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.