Jay Jianhui Chen
6Patents
2h-index
21Co-inventors
47Inventor score
Filing activity: Oct 27, 2008 → May 21, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9903823B2 | Metrology method and apparatus | Physics | 7 | Active |
| US8094428B2 | Wafer grounding methodology | Electricity | 5 | Active |
| US11281113B2 | Method for determining stack configuration of substrate | Physics | 2 | Active |
| US10310388B2 | Metrology method and apparatus and associated computer product | Physics | 1 | Active |
| US10983440B2 | Selection of substrate measurement recipes | Physics | 0 | Active |
| US10551750B2 | Metrology method and apparatus and associated computer product | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.