Jeff Gemar
6Patents
3h-index
11Co-inventors
46Inventor score
Filing activity: Mar 18, 1998 → May 18, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7075175B2 | Systems and methods for testing packaged dies | Physics | 107 | Expired |
| US6262989A | Apparatus and method for providing different quality of service connections in a tunnel mode | Electricity | 30 | Expired |
| US6865503B2 | Method and apparatus for telemetered probing of integrated circuit operation | Physics | 15 | Expired |
| US7049632B2 | Method and apparatus for optical probing of integrated circuit operation | Electricity | 2 | Expired |
| US7327732B2 | Method and apparatus for combined framing and packet delineation | Electricity | 2 | Expired |
| US7772831B2 | Systems and methods for testing packaged dies | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.