Jerzy Lobacz
6Patents
4h-index
7Co-inventors
46Inventor score
Filing activity: Nov 3, 1995 → Oct 6, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5742174A | Membrane for holding a probe tip in proper location | Physics | 136 | Expired |
| US6580283B1 | Wafer level burn-in and test methods | Physics | 92 | Expired |
| US5884395A | Assembly structure for making integrated circuit chip probe cards | Emerging Cross-Sectional Technologies | 41 | Expired |
| US6682945B2 | Wafer level burn-in and electrical test system and method | Electricity | 5 | Expired |
| US7619428B2 | Wafer level burn-in and electrical test system and method | Electricity | 1 | Expired |
| US7928754B2 | Wafer level burn-in and electrical test system and method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.