John Kuban
3Patents
3h-index
5Co-inventors
39Inventor score
Filing activity: Sep 17, 1987 → Mar 5, 1993
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5428622A | Testing architecture with independent scan paths | Physics | 46 | Expired |
| US4745574A | Microcode testing of PLA's in a data processor | Physics | 5 | Expired |
| US4744049A | Microcode testing of a cache in a data processor | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.