Jonathan E. Spowart
13Patents
4h-index
14Co-inventors
57Inventor score
Filing activity: Nov 13, 2002 → Mar 23, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9025333B1 | Tunable thermal switch | Mechanical Engineering; Lighting; Heating | 12 | Active |
| US7317964B1 | High speed and repeatability serial sectioning method for 3-D reconstruction of microstructures | Physics | 7 | Expired |
| US9102576B1 | Particulate-based reactive nanocomposites and methods of making and using the same | Performing Operations; Transporting | 4 | Active |
| US7319915B1 | High speed and repeatability serial sectioning device for 3-D reconstruction of microstructures | Physics | 4 | Expired |
| US7319914B1 | High speed and repeatability serial sectioning method for 3-D reconstruction of microstructures using scanning electron microscope | Physics | 3 | Expired |
| US7319916B1 | High speed and repeatability serial sectioning method for 3-D reconstruction of microstructures using optical microscopy | Physics | 3 | Expired |
| US7364692B1 | Metal matrix composite material with high thermal conductivity and low coefficient of thermal expansion | Performing Operations; Transporting | 2 | Expired |
| US6972109B1 | Method for improving tensile properties of AlSiC composites | Performing Operations; Transporting | 2 | Expired |
| US6869566B1 | Method of fabricating metallic glasses in bulk forms | Performing Operations; Transporting | 1 | Expired |
| US9120710B1 | Particulate-based reactive nanocomposites and methods of making and using the same | Performing Operations; Transporting | 0 | Active |
| US8551441B1 | Control of crystallographic texture and grain size in bulk thermoelectric materials through constrained deformation | Chemistry; Metallurgy | 0 | Active |
| US12104998B2 | Device for measuring property changes via in-situ micro-viscometry | Physics | 0 | Active |
| US11313778B1 | In-situ micro-viscometry for low-cost cure monitoring and control | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.