Inventor · Deer Park, NY, US

Julius Schlesinger

2Patents
2h-index
3Co-inventors
30Inventor score

Filing activity: Nov 12, 1975 → Apr 7, 1977

Most-cited inventions

PatentTitleAreaCited byStatus
US4155009A Thickness measurement instrument with memory storage of multiple calibrations Physics 29 Expired
US4079237A Card controlled beta backscatter thickness measuring instrument Physics 15 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.