Card controlled beta backscatter thickness measuring instrument
US4079237A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 12, 1975 |
| Grant date | Mar 14, 1978 |
| Priority date | — |
| Expiry date | Nov 12, 1995 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved beta backscatter instrument for the non-destructive measurement of the thickness of thin coatings on a substrate. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.