Thickness measurement instrument with memory storage of multiple calibrations
US4155009A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 7, 1977 |
| Grant date | May 15, 1979 |
| Priority date | — |
| Expiry date | Apr 7, 1997 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved backscatter instrument for the nondestructive measurement of coatings on a substrate. A memory having selectable memory areas, each area having stored intelligence available which is determinative of the shape of a functional plot of coating thickness versus backscatter counts per minute unique for each particular combination of emitting isotope, substrate material, coating material and physical characteristics of the measuring instrument. A memory selector switch connects a selected area of memory to a microprocessor operating under program control whereby the microprocessor reads the intelligence stored at the selected area and converts the backscattered count of the coating being measured into indicia of coating thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.