Kazutaka Nimura
7Patents
3h-index
13Co-inventors
50Inventor score
Filing activity: Nov 21, 2001 → Oct 9, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7034296B2 | Method of forming a sample image and charged particle beam apparatus | Electricity | 12 | Expired |
| US6963067B2 | Scanning electron microscope and sample observing method using it | Electricity | 6 | Expired |
| US7361894B2 | Method of forming a sample image and charged particle beam apparatus | Electricity | 3 | Active |
| US7164126B2 | Method of forming a sample image and charged particle beam apparatus | Electricity | 2 | Expired |
| US10204761B2 | Charged particle beam device, electron microscope and sample observation method | Electricity | 1 | Active |
| US7800059B2 | Method of forming a sample image and charged particle beam apparatus | Electricity | 1 | Active |
| US10269533B2 | Anti-contamination trap, and vacuum application device | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.