Kei Shimura
39Patents
7h-index
41Co-inventors
69Inventor score
Filing activity: Jun 7, 1991 → Aug 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6421451B2 | Step difference detection apparatus and processing apparatus using the same | Physics | 27 | Expired |
| US5475210A | Noise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser device | Electricity | 22 | Expired |
| US5250796A | Noise reduction system for optical record and reproduction apparatus using auto-power controlled semiconductor laser device | Electricity | 13 | Expired |
| US6095656A | Backlighting apparatus and display apparatus using the same | Physics | 11 | Expired |
| US5216528A | Three-dimensional multiplex hologram | Physics | 11 | Expired |
| US5949569A | Projection display apparatus and spatial light modulation device applied to the same | Physics | 10 | Expired |
| US8131058B2 | Method and apparatus for visual inspection | Physics | 7 | Active |
| US8126259B2 | Method and apparatus for visual inspection | Physics | 6 | Active |
| US7672799B2 | Defect inspection apparatus and defect inspection method | Physics | 5 | Active |
| US6577584B1 | Method and apparatus for detecting light from a multilayered object | Physics | 3 | Expired |
| US11079275B2 | Far-infrared spectroscopy device | Physics | 3 | Active |
| US9513228B2 | Defect inspection method and its device | Physics | 3 | Active |
| US7746453B2 | Pattern defect inspection apparatus and method | Physics | 3 | Active |
| US8467048B2 | Pattern defect inspection apparatus and method | Physics | 2 | Active |
| US9851548B2 | Optical microscope device and testing apparatus comprising same | Physics | 2 | Active |
| US9164042B2 | Device for detecting foreign matter and method for detecting foreign matter | Emerging Cross-Sectional Technologies | 2 | Active |
| US7706598B2 | Method and apparatus for visual inspection | Physics | 2 | Active |
| US8194969B2 | Method and apparatus for visual inspection | Physics | 2 | Active |
| US9976966B2 | Defect inspection method and its device | Physics | 2 | Active |
| US11016023B1 | Far-infrared spectroscopic device and far-infrared spectroscopic method | Physics | 2 | Active |
| US8351683B2 | Inspection apparatus and inspection method | Physics | 1 | Active |
| US8472697B2 | Method and apparatus for visual inspection | Physics | 1 | Active |
| US10948347B2 | Far-infrared spectroscopy device | Physics | 1 | Active |
| US10113959B2 | Terahertz wave generating device and spectroscopic device using same | Electricity | 1 | Active |
| US7953567B2 | Defect inspection apparatus and defect inspection method | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.