Ken Sunakawa
3Patents
1h-index
7Co-inventors
41Inventor score
Filing activity: Sep 24, 1998 → Jun 30, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6140131A | Method and apparatus for detecting heavy metals in silicon wafer bulk with high sensitivity | Emerging Cross-Sectional Technologies | 16 | Expired |
| US11761118B2 | Carbon-doped silicon single crystal wafer and method for manufacturing the same | Electricity | 0 | Active |
| US11408092B2 | Method for heat-treating silicon single crystal wafer | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.