Kevin T. Wu
5Patents
4h-index
8Co-inventors
46Inventor score
Filing activity: Jul 18, 2002 → May 9, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8750597B2 | Robust inspection alignment of semiconductor inspection tools using design information | Physics | 60 | Active |
| USD478910S1 | Optical scanner | General | 12 | Expired |
| US9037685B2 | Intelligent migration between devices having different hardware or software configuration | Electricity | 10 | Active |
| US8135798B2 | Over-the-air device services and management | Electricity | 8 | Active |
| US9390884B2 | Method of inspecting a semiconductor substrate | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.