Kou Wada
6Patents
5h-index
8Co-inventors
48Inventor score
Filing activity: Jun 24, 1986 → Jul 1, 1993
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4980639A | Method and apparatus for testing integrated electronic device | Physics | 37 | Expired |
| US5006795A | Charged beam radiation apparatus | Electricity | 30 | Expired |
| US5097204A | Method and apparatus for evaluating the capacitance of an integrated electronic device using an E beam | Physics | 22 | Expired |
| US4851768A | Characteristic test apparatus for electronic device and method for using the same | Physics | 19 | Expired |
| US4928010A | Observing a surface using a charged particle beam | Electricity | 13 | Expired |
| US5357830A | Cable cutting apparatus with mechanism for preventing erroneous cable cutting | Emerging Cross-Sectional Technologies | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.