Kueir-Weei Chour
15Patents
5h-index
34Co-inventors
66Inventor score
Filing activity: Nov 23, 1994 → Dec 16, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6565718B1 | Magnetic recording medium with high density, thin dual carbon overcoats | Emerging Cross-Sectional Technologies | 12 | Expired |
| US6303214A | Magnetic recording medium with high density thin dual carbon overcoats | Emerging Cross-Sectional Technologies | 12 | Expired |
| US7361380B1 | Process for improving corrosion resistance of thin-film recording media & media obtained thereby | Physics | 6 | Expired |
| US6572958B1 | Magnetic recording media comprising a silicon carbide corrosion barrier layer and a c-overcoat | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6660413B1 | Component of a magnetic recording medium with sealing layer for corrosion protection | Emerging Cross-Sectional Technologies | 5 | Expired |
| US7691499B2 | Corrosion-resistant granular magnetic media with improved recording performance and methods of manufacturing same | Physics | 4 | Active |
| US6855439B1 | Highly oriented longitudinal magnetic media on direct textured glass substrates | Emerging Cross-Sectional Technologies | 4 | Expired |
| US8728637B2 | Corrosion resistant granular magnetic stack | Physics | 2 | Active |
| US7736766B2 | Magnetic storage media with Ag, Au-containing magnetic layers | Physics | 1 | Active |
| US10793944B2 | Perpendicular recording media with enhanced anisotropy through energy assisted segregation | Physics | 1 | Active |
| US5855956A | Method for autostoichiometric chemical vapor deposition | Chemistry; Metallurgy | 1 | Expired |
| US8008632B2 | Two-zone ion beam carbon deposition | Physics | 0 | Active |
| US8101292B2 | Magnetic storage media with Ag, Au-containing magnetic layers | Physics | 0 | Active |
| US8946651B2 | Multiple anode ion source | Physics | 0 | Active |
| US8053096B2 | Nickel based alloy layer for perpendicular recording media | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.