Kuniyasu Nakamura
16Patents
9h-index
35Co-inventors
72Inventor score
Filing activity: Jan 26, 1978 → Apr 23, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6875984B2 | Bio electron microscope and observation method of specimen | Electricity | 51 | Expired |
| US5866905A | Electron microscope | Electricity | 35 | Expired |
| US6531697B1 | Method and apparatus for scanning transmission electron microscopy | Electricity | 32 | Expired |
| US6051834A | Electron microscope | Electricity | 32 | Expired |
| US6750451B2 | Observation apparatus and observation method using an electron beam | Electricity | 17 | Expired |
| US6548811B1 | Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope | Electricity | 17 | Expired |
| US6822233B2 | Method and apparatus for scanning transmission electron microscopy | Electricity | 16 | Expired |
| USD571385S1 | Electron microscope | General | 11 | Expired |
| US8878130B2 | Scanning electron microscope and scanning transmission electron microscope | Electricity | 10 | Active |
| US7372029B2 | Scanning transmission electron microscope and scanning transmission electron microscopy | Electricity | 8 | Active |
| US7285776B2 | Scanning transmission electron microscope and electron energy loss spectroscopy | Electricity | 6 | Expired |
| US7227144B2 | Scanning transmission electron microscope and scanning transmission electron microscopy | Electricity | 4 | Expired |
| US9293293B2 | Electron gun and charged particle beam device having an aperture with flare-suppressing coating | Electricity | 3 | Active |
| US4160074A | Polyisocyanate foam having isotropic cells and method and apparatus for preparing same | Emerging Cross-Sectional Technologies | 1 | Expired |
| US11756764B2 | Charged particle beam apparatus and method of controlling charged particle beam apparatus | Electricity | 0 | Active |
| US8710438B2 | Scanning transmission electron microscope and axial adjustment method thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.