Leonel Nino
2Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Sep 27, 2002 → Jul 25, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7028234B2 | Method of self-repairing dynamic random access memory | Physics | 81 | Expired |
| US7852677B2 | Method of using hot-carrier-injection degradation as a programmable fuse/switch | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.