Luc Palau
3Patents
1h-index
8Co-inventors
37Inventor score
Filing activity: Oct 7, 2005 → Mar 25, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7263011B2 | Memory circuit with flexible bitline-related and/or wordline-related defect memory cell substitution | Physics | 4 | Expired |
| US7630264B2 | Memory device and testing with write completion detection | Physics | 0 | Active |
| US12009041B2 | Apparatus and method for detecting errors in a memory device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.