Luigi Mele
8Patents
2h-index
16Co-inventors
40Inventor score
Filing activity: Mar 17, 2016 → Aug 8, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10453647B2 | Emission noise correction of a charged particle source | Electricity | 3 | Active |
| US9778377B2 | Method of performing spectroscopy in a transmission charged-particle microscope | Electricity | 2 | Active |
| US9741529B2 | Micro-chamber for inspecting sample material | Electricity | 2 | Active |
| US9812285B2 | Holder assembly for cooperating with a nanoreactor and an electron microscope | Electricity | 1 | Active |
| US12394587B2 | Simple spherical aberration corrector for SEM | Electricity | 0 | Active |
| US10325750B2 | Collision ionization source | Electricity | 0 | Active |
| US10921268B1 | Methods and devices for preparing sample for cryogenic electron microscopy | Electricity | 0 | Active |
| US9899181B1 | Collision ionization ion source | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.