Methods and devices for preparing sample for cryogenic electron microscopy
US10921268B1 · kind B1 · utility
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4References
18Claims
0Family size
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Key dates
| Filing date | Sep 9, 2019 |
| Grant date | Feb 16, 2021 |
| Priority date | — |
| Expiry date | Sep 9, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various methods and devices are provided for searching the optimum sample condition of a sample for cryogenic electron microscopy. Multiple samples with different sample conditions may be screened using a sample inspection device. The sample inspection device includes at least a chamber formed between a top electron transparent layer and a bottom electron transparent layer for holding the sample. Multiple pillars are arranged within the chamber. The sample inspection device includes a window covering at least one of the multiple pillars.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.