Luis A. Basto
6Patents
6h-index
7Co-inventors
48Inventor score
Filing activity: Jun 1, 1999 → Dec 21, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7313739B2 | Method and apparatus for testing embedded cores | Physics | 37 | Expired |
| US6348825B1 | High performance, low power, scannable flip-flop | Electricity | 26 | Expired |
| US6675364B1 | Insertion of scan hardware | Physics | 24 | Expired |
| US6341361B1 | Graphical user interface for testability operation | Physics | 22 | Expired |
| US7568141B2 | Method and apparatus for testing embedded cores | Physics | 17 | Active |
| US6959256B2 | Universally accessible fully programmable memory built-in self-test (MBIST) system and method | Physics | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.