Marc Loranger
4Patents
3h-index
12Co-inventors
47Inventor score
Filing activity: Jul 21, 1999 → Dec 27, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6587979B1 | Partitionable embedded circuit test system for integrated circuit | Physics | 65 | Expired |
| US6351814B1 | Field programmable gate array with program encryption | Physics | 29 | Expired |
| US8587331B2 | Test systems and methods for testing electronic devices | Physics | 9 | Active |
| US7058535B2 | Test system for integrated circuits with serdes ports | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.