Marcel Trimpl
4Patents
2h-index
10Co-inventors
37Inventor score
Filing activity: Aug 25, 2015 → Sep 23, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9767986B2 | Scanning electron microscope and methods of inspecting and reviewing samples | Electricity | 9 | Active |
| US10466212B2 | Scanning electron microscope and methods of inspecting and reviewing samples | Electricity | 2 | Active |
| US11699607B2 | Segmented multi-channel, backside illuminated, solid state detector with a through-hole for detecting secondary and backscattered electrons | Electricity | 0 | Active |
| US11610757B2 | Sensor module for scanning electron microscopy applications | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.