Marion Batz
2Patents
1h-index
12Co-inventors
37Inventor score
Filing activity: Jun 30, 2015 → Dec 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9336983B2 | Scanning particle microscope and method for determining a position change of a particle beam of the scanning particle microscope | Electricity | 4 | Active |
| US11961705B2 | Method and apparatus for examining a beam of charged particles | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.