Mark Davidson
16Patents
10h-index
8Co-inventors
65Inventor score
Filing activity: May 6, 1986 → Feb 13, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5112129A | Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology | Physics | 194 | Expired |
| US4818110A | Method and apparatus of using a two beam interference microscope for inspection of integrated circuits and the like | Physics | 167 | Expired |
| US7061623B2 | Interferometric back focal plane scatterometry with Koehler illumination | Physics | 123 | Expired |
| US5282088A | Aplanatic microlens and method for making same | Physics | 65 | Expired |
| US6738176B2 | Dynamic multi-wavelength switching ensemble | Emerging Cross-Sectional Technologies | 62 | Expired |
| US6612705B1 | Mini-optics solar energy concentrator | Emerging Cross-Sectional Technologies | 44 | Expired |
| US6843573B2 | Mini-optics solar energy concentrator | Emerging Cross-Sectional Technologies | 33 | Expired |
| US7115881B2 | Positioning and motion control by electrons, ions, and neutrals in electric fields | Mechanical Engineering; Lighting; Heating | 17 | Expired |
| US6698693B2 | Solar propulsion assist | Emerging Cross-Sectional Technologies | 17 | Expired |
| US8379218B2 | Fiber-based interferometer system for monitoring an imaging interferometer | Emerging Cross-Sectional Technologies | 15 | Active |
| US7978338B2 | Compound reference interferometer | Emerging Cross-Sectional Technologies | 10 | Active |
| US8120781B2 | Interferometric systems and methods featuring spectral analysis of unevenly sampled data | Emerging Cross-Sectional Technologies | 6 | Active |
| US8902431B2 | Low coherence interferometry with scan error correction | Emerging Cross-Sectional Technologies | 5 | Active |
| US8004688B2 | Scan error correction in low coherence scanning interferometry | Emerging Cross-Sectional Technologies | 4 | Active |
| US8107084B2 | Interference microscope with scan motion detection using fringe motion in monitor patterns | Physics | 2 | Active |
| US7054071B2 | Mireau interference objective lens | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.