Mark E. Culp
2Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Jul 12, 1999 → Aug 2, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6263590A | Method and apparatus for controlling byproduct induced defect density | Chemistry; Metallurgy | 5 | Expired |
| US7217578B1 | Advanced process control of thermal oxidation processes, and systems for accomplishing same | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.