Mark Wagner
14Patents
7h-index
17Co-inventors
63Inventor score
Filing activity: Dec 15, 1987 → Mar 16, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5659172A | Reliable defect detection using multiple perspective scanning electron microscope images | Electricity | 92 | Expired |
| US4712429A | Windscreen and two microphone configuration for blast noise detection | Electricity | 21 | Expired |
| US5158422A | Method and apparatus for shaping and finishing lenses | Emerging Cross-Sectional Technologies | 13 | Expired |
| US7633041B2 | Apparatus for determining optimum position of focus of an imaging system | Physics | 11 | Active |
| US7804993B2 | Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images | Physics | 9 | Active |
| US7961763B2 | System for detection of wafer defects | Physics | 8 | Active |
| US7525659B2 | System for detection of water defects | Physics | 8 | Expired |
| US7813541B2 | Method and apparatus for detecting defects in wafers | Physics | 5 | Active |
| US7843559B2 | System for detection of wafer defects | Physics | 4 | Active |
| US7477383B2 | System for detection of wafer defects | Physics | 3 | Active |
| US7369238B2 | Lens blank alignment and blocking device and method | Physics | 2 | Active |
| USD489825S1 | Lens blocker | General | 2 | Expired |
| US7193714B2 | Lens blank alignment and blocking device and method | Physics | 0 | Expired |
| US6869333B2 | Lens blank alignment and blocking device and method | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.