Markus Brandner
3Patents
1h-index
6Co-inventors
37Inventor score
Filing activity: Jun 18, 2008 → Jul 27, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8368393B2 | Measurement method, sensor arrangement and measurement system | Physics | 3 | Active |
| US10488434B2 | Characterizing a height profile of a sample by side view imaging | Physics | 1 | Active |
| US10684307B2 | Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.