Inventor · Dresden, DE

Martin Dimer

3Patents
1h-index
7Co-inventors
37Inventor score

Filing activity: Aug 11, 2010 → Jun 30, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US8259294B2 Method and device for measuring optical characteristic variables of transparent, scattering measurement objects Physics 4 Active
US8669463B2 Method for depositing a transparent conductive oxide (TCO) film on a substrate and thin-film solar cell Emerging Cross-Sectional Technologies 0 Active
US12369428B2 Method of forming transparent layers for a solar cell Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.