Patent · US Active

Method and device for measuring optical characteristic variables of transparent, scattering measurement objects

US8259294B2 · kind B2 · utility

4Cited by

6References

15Claims

0Family size

Assignee

VON ARDENNE Anlagentechnik GmbH · DE

Inventors

Holger Proehl · Dresden, DE
Thomas Knoth · Dresden, DE
Tina Schoessler · Dresden, DE
Martin Dimer · Dresden, DE

Key dates

Filing date	Aug 11, 2010
Grant date	Sep 4, 2012
Priority date	—
Expiry date	Aug 11, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/065
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and device are provided for measurement of various transmission and reflection values of transparent measurement objects having transparent layers in an inline coating system, and particularly the turbidity of the measurement object during a relative movement between the measurement object and measuring device. Transmission fractions are measured in two different radiation directions of a lighting source emitting diffuse light by two photodetectors, by which a fraction of diffuse light of the lighting source is suppressed in one direction.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.