Matthew Moe
7Patents
1h-index
30Co-inventors
47Inventor score
Filing activity: Jan 3, 2008 → Jun 30, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10978438B1 | IC with test structures and E-beam pads embedded within a contiguous standard cell area | Electricity | 4 | Active |
| US7827516B1 | Method and system for grouping logic in an integrated circuit design to minimize number of transistors and number of unique geometry patterns | Physics | 1 | Active |
| US11081477B1 | IC with test structures and e-beam pads embedded within a contiguous standard cell area | Electricity | 0 | Active |
| US11107804B1 | IC with test structures and e-beam pads embedded within a contiguous standard cell area | Electricity | 0 | Active |
| US11075194B1 | IC with test structures and E-beam pads embedded within a contiguous standard cell area | Electricity | 0 | Active |
| US11081476B1 | IC with test structures and e-beam pads embedded within a contiguous standard cell area | Electricity | 0 | Active |
| US11018126B1 | IC with test structures and e-beam pads embedded within a contiguous standard cell area | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.