Michael Ben-Yishay
3Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Jul 31, 2007 → Jun 27, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8238647B2 | Method and system for defect detection | Physics | 13 | Active |
| US8213024B2 | Method and system for aerial imaging of a reticle | Physics | 1 | Active |
| US7970201B2 | Method and system for defect detection | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.