Michael Kessler
4Patents
3h-index
9Co-inventors
47Inventor score
Filing activity: Sep 24, 1976 → Jul 30, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4087747A | Arrangement for testing electric samples with a plurality of probe contact points | Physics | 22 | Expired |
| US7225376B2 | Method and system for coding test pattern for scan design | Physics | 6 | Expired |
| US6983407B2 | Random pattern weight control by pseudo random bit pattern generator initialization | Electricity | 5 | Expired |
| US6491205B1 | Assembly of multi-chip modules using eutectic solders | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.