Michael Ruprecht
4Patents
2h-index
11Co-inventors
45Inventor score
Filing activity: Nov 6, 1996 → Aug 27, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6603321B2 | Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiring | Electricity | 24 | Expired |
| US6492247B1 | Method for eliminating crack damage induced by delaminating gate conductor interfaces in integrated circuits | Electricity | 19 | Expired |
| US6134241A | Telecommunication system | Electricity | 2 | Expired |
| US11171474B2 | Electric arc detection based on frequency analysis | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.