Inventor · Baoshan, TW

Min-Yi Lin

2Patents
2h-index
3Co-inventors
30Inventor score

Filing activity: Apr 29, 1996 → Mar 10, 2000

Most-cited inventions

PatentTitleAreaCited byStatus
US6297554A Dual damascene interconnect structure with reduced parasitic capacitance Electricity 209 Expired
US5652172A Method for controlling the etch profile of an aperture formed through a multi-layer insulator layer Electricity 10 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.