Mincent Lee
6Patents
2h-index
7Co-inventors
40Inventor score
Filing activity: Jul 7, 2008 → May 4, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9658281B2 | Alignment testing for tiered semiconductor structure | Physics | 4 | Active |
| US8095832B2 | Method for repairing memory and system thereof | Physics | 2 | Active |
| US10073135B2 | Alignment testing for tiered semiconductor structure | Physics | 2 | Active |
| US10641819B2 | Alignment testing for tiered semiconductor structure | Physics | 1 | Active |
| US9915699B2 | Integrated fan-out pillar probe system | Physics | 0 | Active |
| US11231453B2 | Alignment testing for tiered semiconductor structure | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.