Nadav Carmel
5Patents
2h-index
37Co-inventors
43Inventor score
Filing activity: Sep 11, 2014 → May 22, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9903711B2 | Feed forward of metrology data in a metrology system | Physics | 4 | Active |
| US9851300B1 | Decreasing inaccuracy due to non-periodic effects on scatterometric signals | Physics | 3 | Active |
| US10831108B2 | Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology | Electricity | 2 | Active |
| US9726984B2 | Aperture alignment in scatterometry metrology systems | Physics | 0 | Active |
| US11704584B2 | Fast and accurate machine learning by applying efficient preconditioner to kernel ridge regression | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.