Naoki Date
7Patents
5h-index
19Co-inventors
60Inventor score
Filing activity: Oct 20, 1981 → Feb 25, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4431915A | Electron beam apparatus | Electricity | 15 | Expired |
| US6021295A | Developing apparatus | Performing Operations; Transporting | 11 | Expired |
| US6831278B2 | System and method for electron beam irradiation | Electricity | 7 | Expired |
| US6737660B2 | Electron beam irradiation apparatus and electron beam irradiating method | Electricity | 5 | Expired |
| US4439681A | Charged particle beam scanning device | Electricity | 5 | Expired |
| US6734437B2 | System and method for electron beam irradiation | Electricity | 3 | Expired |
| US6953939B2 | Testing apparatus using scanning electron microscope | Electricity | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.