Narain D. Arora
3Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Dec 8, 1997 → Mar 22, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5999010A | Method of measuring interconnect coupling capacitance in an IC chip | Physics | 36 | Expired |
| US7089516B2 | Measurement of integrated circuit interconnect process parameters | Electricity | 13 | Expired |
| US7088121B1 | Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.