Narjes JAVAHERI
4Patents
0h-index
15Co-inventors
28Inventor score
Filing activity: Apr 27, 2018 → Mar 22, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11448974B2 | Metrology parameter determination and metrology recipe selection | Physics | 0 | Active |
| US10990020B2 | Metrology parameter determination and metrology recipe selection | Physics | 0 | Active |
| US10705437B2 | Metrology method and apparatus, computer program and lithographic system | Electricity | 0 | Active |
| US12105432B2 | Metrology method and associated computer product | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.